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#7楼说:
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1教授+1博士后+2博士的经典之作(中文的)...。:em33
CHALLENGES FOR THE APPLICATION OF LEAD-FREE SOLDERS ON BALL GRID ARRAY PACKAGES
Abstract The adoption of Pb-free solders in lieu of Pb solders is an inevitable trend in the electronics industry. This study sums up the failure modes to which the ball grid array packaging process is susceptible when various Pb-free solders, such as Sn-3.5Ag, Sn-0.9Cu, Sn-58Bi, Sn-51In, Sn-20In-0.8Cu, Sn-20In-2.8Ag, Sn-4Ag-0.5Cu, Sn-3Ag- 0.5Cu and Sn-4Ag-5Cu, are employed. Examples of potential failure modes include: intermetallic embrittlement, gold embrittlement, void formation, Ag3Sn plate formation, pad lifting, Sn-Bi joint degradation caused by Pb contamination, fatigue-induced ductile/brittle transition, Ag thick film dissolution, and non-wetting due to precipitation.
Keywords: electronic packaging, lead-free solders, BGA package, failure analysis.
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